IOLTS 2006 - Call for Papers

CALL FOR PAPERS

Scope and Purpose -- Author Information -- About the Location -- Contact -- Committees

Scope and Purpose

Issues related to on-line testing are increasingly important in modern electronics systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies. Nanometer technologies adversely impact noise margins and make integrating on-line test mandatory in many modern ICs. The Symposium is also emphasizing on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in secure chips. The Symposium is sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC), co-organized by the TTTC On-line Testing TAC and the European Group of TTTC, in collaboration with TIMA Laboratory and University of Bologna.

The topics include (but are not limited to) the following ones:

Reliability issues in nanometer technologies
Field diagnosis, maintainability and reconfiguration
On-line testing of analog and mixed signal circuits
On-line test in the continuous operation of large systems
On-line testing in automotive, railway and avionics
On-line testing in industrial control
On-line monitoring of current, temperature and other reliability indicators
Self-checking circuits and coding theory
On-line and off-line BIST
Synthesis of on-line testable circuits
Fault-tolerant and fail-safe systems
Dependability evaluation
On-line power monitoring and control
Radiation effects
Secure circuit design
Fault-based attacks and counter measures

Submissions

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The IOLTS Program Committee invites authors to submit papers in the above areas. All submissions should have a title page with the name, address, phone number, fax number, and e-mail address of the contact author. Accepted papers will be included in formal Proceedings to be published by the IEEE. Papers must be submitted electronically in PDF via the Symposium Web site.

Please observe the following key dates:

Submission deadline: February 3rd, 2006
Notification of acceptance: March 25th, 2006

About the Location

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Como Lake is the third largest Italian lake. A few kilometers from the Swiss border, from the Milan Malpensa airport, and from Milan, it is easily reachable by air (with direct flights to Malpensa from all major international airports), by car, as well as by train. It is situated in a unique and rich environment, where within a few miles of industrial areas you can find the mountains, the lake, and the beautiful valleys of the Alps.

Contact

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Submission Information

Régis Leveugle
TIMA Laboratory
46, av. Felix Viallet
38031 Grenoble - France
Tel: +33 (0) 4 76 57 46 86
Fax : +33 (0) 4 76 47 38 14
Regis.Leveugle@imag.fr

General Information

Cecilia Metra
University of Bologna
Viale Risorgimento 2
40136 Bologna, Italy
Tel.: +39 051 2093038
Fax: +39 051 2093073
cmetra@deis.unibo.it

Michael Nicolaidis
TIMA Laboratory
46, av. Felix Viallet
38031 Grenoble - France
Tel: +33 (0) 4 76 57 46 96
Fax: +33 (0) 4 76 47 38 14
Michael.Nicolaidis@imag.fr

Committees

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ORGANIZING COMMITTEE

General Chairs
C. Metra, U. Bologna
M. Nicolaidis, TIMA Laboratory

Program Chairs
R. Aitken, ARM
R. Leveugle, TIMA Laboratory

Vice-General Chairs
L. Anghel, TIMA Laboratory
Y. Zorian, Virage Logic

Vice-Program Chairs
T.M. Mak, Intel
K. Roy, Purdue U.

Local Chair
M. Omana, U. Bologna

Publicity Chair
C. Lazzari, TIMA Laboratory

Finance Chair
D. Rossi, U. Bologna

Publications Chair
M. Portolan, TIMA Laboratory

Audio Visual Chair
V. Maingot, TIMA Laboratory

ETTTC Liaison
Z. Peng, Linköping U.

PROGRAM COMMITTEE

J. Abraham, U. Texas at Austin
R. Baumann, Texas Instruments
E. Boehl, Robert Bosch GmbH
C. Bolchini, Politec. di Milano
D. Bradley, ARM UK
N. Buard, EADS
S. Chakravarty, Intel
Y. Crouzet, LAAS
A. Dandache, U. Metz
P. Fouillat, IXL-ENSEIRB
P. Girard, LIRMM
D. Gizopoulos, Piraeus U.
M. Goessel, U. Postdam
Th. Haniotakis, U. Southern Illinois
J. Hayes, U. Michigan
T. Heijmen, Philips Research Labs
S. Hellebrand, U. Innsbruck
A. Ivanov, U. Brit. Columbia
R. Iyer, U. Illinois at Urbana Champaign
A. Krasniewski, Warsaw U. T.
C. Landrault, LIRMM
A. Lemarechal, Oberthur Card Systems
I. Levin, U. Tel Aviv
H. Manhaeve, QStar
S. Mitra, Stanford U.
D. Nikolos, U. Patras
A. Orailoglu, U. Cal. San Diego
I. Parulkar, SUN
A. Paschalis, U. Athens
M. Pflanz, IBM Germany
S. Piestrak, U. Metz
M. Pignol, CNES
D. Pradhan, U. Bristol
P. Prinetto, Politec. di Torino
M. Rebaudengo, Politec. di Torino
P. Sanda, IBM
J. Segura, U. Illes Balears
J. P. Seifert, Intel
N. Seifert, Intel
E. Simeu, TIMA Laboratory
M. Sonza Reorda, Politec. di Torino
J. Sosnowski, Warsaw U. T.
L. Sourgen, STMicroelectronics
G. Stamoulis, U. Crete
B. Straube, Fraunhofer IIS/EAS
J. P. Teixeira, IST/INESC-ID
N.A. Touba, U. Texas
S. Tragoudas, U. Southern Illinois
Y. Tsiatouhas, ISD
F. Vargas, PUCRS
R. Velazco, TIMA Laboratory
I. Verbauwhede, K. U. Leuven
H.T. Vierhaus, Brandenburg T.U.
M. Violante, Politec. di Torino
H. J. Wunderlich, U. Stuttgart

For more information, visit us on the web at: http://tima.imag.fr/conferences/iolts/

The 12th IEEE International On-Line Testing Symposium (IOLTS'06) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC), and co-organized by the TTTC On-line Testing TAC and the European Group of TTTC, in collaboration with TIMA Laboratory and University of Bologna.